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Characterization of neutron transmutation doped (NTD) Ge for low temperature sensor development

机译:中子嬗变掺杂(NTD)Ge的表征为低   温度传感器开发

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摘要

Development of NTD Ge sensors has been initiated for low temperature (mK)thermometry in The India-based Tin detector (TIN.TIN). NTD Ge sensors areprepared by thermal neutron irradiation of device grade Ge samples at Dhruvareactor, BARC, Mumbai. Detailed measurements have been carried out inirradiated samples for estimating the carrier concentration and fast neutroninduced defects. The Positron Annihilation Lifetime Spectroscopy (PALS)measurements indicated monovacancy type defects for all irradiated samples,while Channeling studies employing RBS with 2 MeV alpha particles, revealed nosignificant defects in the samples exposed to fast neutron fluence of $\sim4\times10^{16}/cm^2$. Both PALS and Channeling studies have shown that vacuumannealing at 600 $^\circ$C for $\sim2$ hours is sufficient to recover thedamage in the irradiated samples, thereby making them suitable for the sensordevelopment.
机译:NTD Ge传感器的开发已经开始用于印度锡探测器(TIN.TIN)中的低温(mK)温度计。 NTD Ge传感器由孟买BARC Dhruvareactor的设备级Ge样品的热中子辐照制备。已经对辐照过的样品进行了详细的测量,以估计载流子浓度和快速中子诱发的缺陷。正电子An没寿命谱(PALS)测量表明,所有辐照样品均具有单空位型缺陷,而采用RBS和2 MeVα粒子的通道研究表明,暴露于$ \ sim4 \ times10 ^ {16 / cm ^ 2 $。 PALS和Channeling研究均表明,在600℃/℃下进行2个小时的真空退火足以恢复被辐照样品中的损伤,从而使其适合于传感器的开发。

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